Oral Presentation 13th Asia Pacific Microscopy Congress 2025

Optical Sectioning Microscopy by Scanning Transmission Electron Microscope equipped with aberration corrector (114192)

Hiroki Hashiguchi 1 , Yu Jimbo 1 , Ichiro Ohnishi 1 , Ryusuke Sagawa 1 , Eiji Okunishi 1
  1. JEOL Ltd., Akishima, TOKYO, Japan