Talk Title: A community-based, collaborative approach to single-molecule super-resolution microscopy
Session Chair: Masahide Kikkawa
Talk title: TESCAN AMBER 2 and TESCAN AMBER X 2: New Generation FIB-SEMs for Speed, Utility, Precision
Speaker: Martin Slama, Product marketing manager for FIB SEM
The workshop provides a comprehensive overview of the TESCAN AMBER FIB-SEM series and its capabilities in materials science research. It showcases applications such as sample preparation and rapid multimodal material characterization. These advancements are enabled by innovative technologies, including the Mistral™ Xe plasma FIB column, which allows for precise sample preparation and high-speed milling. Additionally, the integrated AURATM Gentle Ion Beam minimizes sample damage, while the TEM AutoPrep ProTM ensures fully automated preparation of TEM samples. Designed to support researchers at all expertise levels, the TESCAN AMBER series offers exceptional efficiency and precision, along with high-throughput, extensive multimodal material characterization.