Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials (114374)
Hrishikesh Bale
1
,
Nathan Johnson
1
,
Bernd Schulz
2
,
Feng Lin Ng
3
- ZEISS Research Microscopy Solutions, Dublin, CA
- Carl Zeiss Pty Ltd, Australia
- Carl Zeiss Pte. Ltd, Singapore, SINGAPORE