Maximizing 3D X-ray Microscopy Data Fidelity and Throughput with Novel Deep Learning Assisted Reconstruction Algorithms (114381)
Bernd Schulz
1
,
Luna Zhang
2
,
Stephen T. Kelly
3
,
Nathan Johnson
3
,
Feng Lin Ng
2
- Carl Zeiss Pty Ltd, Australia
- Carl Zeiss Pte. Ltd, Singapore, SINGAPORE
- ZEISS Research Microscopy Solutions, Dublin, CA