Pushing the Limits of Fine Feature Detection in 3D X-ray Microscopy: Characterization of Hierarchical Microstructures in TiC Reinforced Nickel Matrix Composites (114383)
Feng Lin Ng
1
,
Luna Zhang
1
,
Hrishikesh Bale
2
,
Kaushik Yanamandra
2
,
Bernd Schulz
3
- Carl Zeiss Pte. Ltd, Singapore, SINGAPORE
- ZEISS Research Microscopy Solutions, Dublin, CA
- Carl Zeiss Pty Ltd, Australia