Oral Presentation
13th Asia Pacific Microscopy Congress 2025
Days
Monday, 3rd February
Tuesday, 4th February
Wednesday, 5th February
Thursday, 6th February
Friday, 7th February
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Speakers
Advanced Surface Characterisation of Minerals using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
(114583)
Susana Brito e Abreu
1
JKMRC, Indooroopilly, QLD, Australia