Oral Presentation 13th Asia Pacific Microscopy Congress 2025

Rapid 3D Characterisation of Grain Boundaries at the Atomic-Scale Using Atom Probe Tomography (115800)

Andrew J Breen 1 , Felix Theska 2 , Hubert Lee 1 , Simon P Ringer 2 , Sophie Primig 1
  1. School of Materials Science & Engineering, The University of NSW, Sydney, NSW, Australia
  2. The Australian Centre for MIcroscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia