Oral Presentation
13th Asia Pacific Microscopy Congress 2025
Days
Monday, 3rd February
Tuesday, 4th February
Wednesday, 5th February
Thursday, 6th February
Friday, 7th February
Search
Speakers
Structural Assessment of (Sub-)Monolayer Coatings in Device Processing at High Spatial Resolving Power by TOF-SIMS Tandem MS Imaging
(116289)
Jacob Schmidt
1
Physical Electronics, CHANHASSEN, MN, United States