Poster Presentation 13th Asia Pacific Microscopy Congress 2025

Development of Pseudo-background Subtraction Function for High-throughput Quantitative Mapping with Electron Probe Microanalyzer (114314)

ShinIchi Hayashi 1 , Rie Wakimoto 1 , Naoki Kato 1 , Takanori Murano 1
  1. JEOL Ltd., Akishima, TOKYO, Japan