Interference of Polarized Electron Beam in Transmission Electron Microscopy (114490)
Makoto Kuwahara
1
,
Satoshi Ogawa
1
,
Hideo Morishita
2
,
Tsunenori Nomaguchi
3
,
Toshihide Agemura
3
- Nagoya University, Nagoya City, AICHI PREFECTURE, Japan
- Research and Development Group, Hitachi, Ltd., Kokubunji, Tokyo, Japan
- Hitachi High-Tech Corporation, Hitachinaka, Ibaraki, Japan