Mapping Electrical Properties Using STEM-EBIC for Electric Field-Induced Resistance Changes in Amorphous Gallium Oxide (114612)
Sanghyo Lee
1
,
Jinseok Ryu
2
,
Seounghun Lee
1
,
Philipp Hein
3
,
Manfred Martin
3
,
Young-Woon Kim
1
,
Miyoung Kim
1
- Materials science and engineering, Seoul National University, Seoul, South Korea
- Imaging and Microscopy, Diamond Light Source, Didcot, Oxfordshire, United Kindom
- Institute of Physical Chemistry, RWTH Aachen University, Aachen, North Rhine-Westphalia, Germany