Oral Presentation 13th Asia Pacific Microscopy Congress 2025

Unique In-Situ Workflow for Characterization of Mechanical and Electrical Properties using AFM-in-SEM Technology (114622)

Veronika Hegrova 1 , Radek Dao 1 , Ondrej Novotny 1 , Filip Ulc 1 , Jan Neuman 1
  1. NenoVision s. r. o., Brno, CZECH REPUBLIC, Czech Republic