Hiroki Kawamoto 13th Asia Pacific Microscopy Congress 2025

Abstracts this author is presenting:

• TEM observation of mirror-microscopy detected epitaxial SiC defects and dynamic structural transitions using an FIB compatible MEMS specimen heating holder — Physical Sciences Poster Session
• Image sharpening by the ES-Corrector for TEM observation of specimen in-liquid — ID03 - Application of Microanalysis (Morning)