Feng Lin Ng 13th Asia Pacific Microscopy Congress 2025

Abstracts this author is presenting:

• The Application of Deep Learning Technology to Automated Petrography Workflows — MS/ID Poster Session
• Revealing Microstructural Complexity in Advanced Battery Systems with Connected and Correlative Microscopy Workflows — MS/ID Poster Session
• Low to Ultra-low kV SEM Imaging of Non-Conductive and Beam Sensitive Biomaterials — MS07 - Soft Materials and Beam Sensitive Materials
• The FIB-SEM Microscope with an Integrated fs-laser for the Atom Probe Tomography (APT) and (scanning) Transmission Electron Microscopy (TEM/STEM) Sample Preparation — Physical Sciences Poster Session